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Identifiers

ISSN :

0145-4676

Linking ISSN (ISSN-L): 0145-4676

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Key-title  

Semiconductor measurement technology. Quarterly report

Identifiers
ISSN :

0145-4676

Linking ISSN (ISSN-L): 0145-4676

Resource information
Archival Status
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Title proper: Semiconductor measurement technology: quarterly report.

Country: United States

Medium: Print

Digital Archives:

HathiTrust, HathiTrust, https://catalog.hathitrust.org/Record/000503167, Restrictions unspecified, 1973/1977


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Status Publisher Keeper From To Updated Extent of archive
Preserved

 U.S. Dept. of Commerce, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]

 HathiTrust

 1973

 1977

 01/12/2024
July/Sept 1973 (r:400-1); 1975 no.1-2; 1974 no.4; 1976-1977 no.1-3; 1973 no.3 v.1974 no.3
Archival Status
Status Publisher Keeper From To Updated Extent of archive
Preserved

 U.S. Dept. of Commerce, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]

 HathiTrust

 1973

 1977

 01/12/2024
July/Sept 1973 (r:400-1); 1975 no.1-2; 1974 no.4; 1976-1977 no.1-3; 1973 no.3 v.1974 no.3
Record information

Last modification date: 29/08/2009

Type of record: Confirmed

ISSN Center responsible of the record: ISSN National Centre for the USA

For all potential issues concerning this bibliographic record (missing or wrong data etc.), please contact the ISSN National Centre mentioned above by clicking on the link.

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