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ISSN :

1537-0755

Linking ISSN (ISSN-L): 1537-0755

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Key-title  

Electronic device failure analysis

Identifiers
ISSN :

1537-0755

Linking ISSN (ISSN-L): 1537-0755

Resource information

Title proper: Electronic device failure analysis.

Country: International organization

Medium: Print



Record information

Last modification date: 04/08/2012

Type of record: Confirmed

ISSN Center responsible of the record: CIEPS - ISSN

Links

Wikidata: www.wikidata.or ... http://www.wikidata.org/entity/Q96325214

FATCAT: fatcat.wiki/con ... https://fatcat.wiki/container/yytcoop3mndkbcdr7j7vfer4bq

Wikidata: www.wikidata.or ... http://www.wikidata.org/entity/Q96325214

FATCAT: fatcat.wiki/con ... https://fatcat.wiki/container/yytcoop3mndkbcdr7j7vfer4bq

Google: www.google.com/ ... https://www.google.com/search?q=ISSN+%221537-0755%22

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Yahoo: search.yahoo.co ... https://search.yahoo.com/search?p=ISSN%20%221537-0755%22

CROSSREF: search.crossref ... https://search.crossref.org/?q=+1537-0755

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