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ISSN Record 2151-1535

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Confirmed record

Key title: IEEE journal of selected topics in applied earth observations and remote sensing (Online)

Identifiers

ISSN:
2151-1535
ISSN-L:
1939-1404

Titles

Abbreviated key title:
IEEE j. sel. top. appl. earth obs. remote sens. (Online)
Title proper:
IEEE journal of selected topics in applied earth observations and remote sensing.
Title variants:
Selected topics in applied earth observations and remote sensing, IEEE journal of
Title variants:
IEEE journal of selected topics in applied earth observations & remote sensing
Title variants:
Journal of selected topics in applied earth observations and remote sensing
Title variants:
Institute of Electrical and Electronic Engineers journal of selected topics in applied earth observations and remote sensing

Publication

Medium:
Online
Other media:
Print
Earliest publisher:
New York, N.Y. :: Institute of Electrical and Electronics Engineers
Issuing body:
Institute of Electrical and Electronics Engineers.
IEEE Geoscience and Remote Sensing Society.
IEEE Committee on Earth Observation.
Normalized publisher:
Institute of Electrical and Electronics Engineers [Wikidata: Q131566]
Normalized publisher (brand):
[Wikidata: ]
Type:
Periodical
Frequency:
Quarterly
Dates of publication:
2008-
Status:
Published
Description:
Began with vol. 1, issue 1 (Mar. 2008).
Country:
UNITED STATES
Language:
English

Online

Subjects

Subject added entry:
Earth Sciences. Geological sciences (55)
Dewey Decimal Classification:
550

Covered by

14 indexing sources

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Archival status

This resource has been partly archived by the keepers network.

Archival Status

Publisher Keeper Status Last updated Access

IEEE

Scholars Portal

Preserved
2025-09-02

IEEE, Inc.

Portico

Preserved
2026-02-12

Record

Created:
2009/10/15
By:
United States
Last modified:
2025/05/07
ISSN Center responsible for the record:
United States

Notes

1:
Description based on first issue; title from journal home page (IEEE Xplore, viewed June 24, 2009).
2:
Latest issue consulted: Vol. 2, issue 2 (June 2009) (IEEE Xplore, viewed Sept. 24, 2009).