Key-title Proceedings (IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems. Online)
Proceedings (IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems. Online)
Title proper: Proceedings.
Other variant title: Defect and Fault Tolerance in VLSI Systems
Other variant title: DFT
Other variant title: Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
Country: United States
Medium: Online
Digital Archives:
Digital Archives:
Scholars Portal, Ontario Council of University Libraries, https://scholarsportal.info, Online access with authorization, 1993/2003
Portico, Portico, https://www.portico.org, Online access with authorization, 1993/1998
Portico, Portico, https://www.portico.org, Online access with authorization, 2000/2003
Record information
Last modification date: 06/02/2021
Type of record: Confirmed
ISSN Center responsible of the record: ISSN National Centre for the USA
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