ISSN Record 2577-1000

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Confirmed record

Key title: Proceedings (Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Onlline)

Identifiers

ISSN:
2577-1000
ISSN-L:
1065-2221
Incorrect ISSN (1):
1065-2221

Titles

Title proper:
Proceedings /
Title variants:
IEEE SEMI-THERM Symposium
Title variants:
Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Title variants:
Annual Semiconductor Thermal Measurement and Management Symposium
Title variants:
SEMI-THERM
Title variants:
Semiconductor Thermal Measurement and Management Symposium

Publication

Medium:
Online
Other media:
Print
Issuing body:
IEEE Components, Hybrids, and Manufacturing Technology Society.
IEEE Semiconductor Thermal Measurement and Management Symposium.
Normalized publisher:
Institute of Electrical and Electronics Engineers [Wikidata: Q131566]
Country:
UNITED STATES

Online

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Archival status

This resource has been partly archived by the keepers network.

Archival Status

Publisher Keeper Status Last updated Access

IEEE, Inc.

Portico

Preserved
2026-02-12

IEEE, Inc.

Portico

Preserved
2026-02-12

IEEE, Inc.

Portico

Preserved
2026-02-12

IEEE, Inc.

Portico

Preserved
2026-02-12

IEEE

Scholars Portal

Preserved
2025-09-02

IEEE

Scholars Portal

Preserved
2025-09-02

Record

Last modified:
2024/12/18
ISSN Center responsible for the record:
United States

Notes

1:
Electronic reproduction.
2:
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
3:
Description based on print version record.
4:
Latest issue consulted: 33rd (2017) (IEEExplore viewed Feb. 27, 2018).